On Power-Constrained System-on-chip Test Scheduling Using Precedence Relationships

This paper presents an efficient method to determine minimum SOC test schedules based on simulated annealing. The problem is solved using a partitioned testing scheme with run to completion that minimizes the number of idle test slots. The method handles SOC test scheduling with and without power co...

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Bibliographic Details
Main Author: Harmanani, Haidar M. (author)
Other Authors: Salamy, Hassan A. (author)
Format: conferenceObject
Published: 2017
Online Access:http://hdl.handle.net/10725/5459
http://dx.doi.org/10.1109/NEWCAS.2006.250936
http://libraries.lau.edu.lb/research/laur/terms-of-use/articles.php
http://ieeexplore.ieee.org/abstract/document/4016967/
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