An Ant Colony Optimization approach for test pattern generation
Test pattern generation is a challenging problem that has an exponential complexity that is aggravated with the continuos increase in circuits size. This paper deals with automatic test pattern generation (ATPG) for combinational circuits, and proposes a new approach based on Ant Colony Optimization...
محفوظ في:
| المؤلف الرئيسي: | |
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| التنسيق: | conferenceObject |
| منشور في: |
2017
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| الوصول للمادة أونلاين: | http://hdl.handle.net/10725/5455 http://dx.doi.org/10.1109/CCECE.2008.4564771 http://libraries.lau.edu.lb/research/laur/terms-of-use/articles.php http://ieeexplore.ieee.org/abstract/document/4564771/ |
| الوسوم: |
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