Microsecond Electron Drift Observed by Band-Pass Kelvin Probe Force Microscopy

Microsecond Electron Drift Observed by Band-Pass Kelvin Probe Force Microscopy

Carrier drift in materials critically influences the performance of devices, such as transistors, solar cells, and lithium-ion batteries. While many advanced Kelvin Probe Force Microscopy (KPFM) techniques have been developed for characterizing ionic drift, visually observing electron drift is chall...

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Bibliographic Details
Main Author: Chunlin Song (14557445) (author)
Other Authors: Fang Wang (105926) (author), Youna Huang (21660975) (author), Wenjie Ming (9675968) (author), Fengyuan Zhang (1424125) (author), Boyuan Huang (18553233) (author), Jiangyu Li (1390402) (author)
Published: 2025
Subjects:
Biophysics
Microbiology
Biotechnology
Space Science
Environmental Sciences not elsewhere classified
Biological Sciences not elsewhere classified
Chemical Sciences not elsewhere classified
Physical Sciences not elsewhere classified
probe deflection along
microsecond temporal resolution
materials critically influences
higher spatiotemporal resolution
frequency spectrum analysis
4 ± 0
characterizing ionic drift
electron drift
solar cells
pass algorithm
noise ratios
necessitating methods
nanometer spatial
ion batteries
instrumental noise
inhomogeneous process
improved signal
difficulty arises
average velocity
applied broadly
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