Supplemental Material
Fig. S1: Summary of alloy composition as a function of SnO2 RF power, and plots of the XPS core level spectra for Ge 3d and Sn 3d respectively for the x=0.69 composition. Fig. S2: AFM scans of as-grown alloy thin films. Table SI: RMS roughness values measured in this study. Fig. S3: STEM/EDS mapping...
Gorde:
| Egile nagusia: | |
|---|---|
| Beste egile batzuk: | |
| Argitaratua: |
2025
|
| Gaiak: | |
| Etiketak: |
Etiketa erantsi
Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!
|