Supplementary Material

More crack distribution maps in the device, EDS line-scan SEM maps and AFM maps, device EDS maps, positive-scan J-V and other relevant data.

Saved in:

Bibliographic Details
Main Author:	Zihong Cai (12790571) (author)
Other Authors:	Yafei Wang (438443) (author), Zuchong Zhao (20760893) (author), Jiacai Liao (20760896) (author), Kai Ma (550768) (author), Junyu Lin (529231) (author), Zecheng Diao (18001161) (author), Si Ling (18512964) (author), Yuanhang Ren (536338) (author), Weiwei Xing (690172) (author), Gongbin Tang (10911644) (author), Ji Ran (20760899) (author), Zhongwei Liang (2068309) (author), Jianhui Zhang (450305) (author), Tao Zou (662198) (author), Fan Zhang (46132) (author), Meicong Wang (20760902) (author)
Published:	2025
Subjects:	Physical sciences perovskite solar cells antisolvent crack ideal factor
Tags:	Add Tag No Tags, Be the first to tag this record!

Similar Items