Supplementary Material

The supplementary material contains additional data and discussions regarding the cross-sectional SEM image of a growth rate calibration sample, annealed vs. un-annealed Hall pad I-V profiles, four-corner vs. mesa isolated Van Der Pauw Hall structures, AFM and DIC microscope surface analysis of all...

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Bibliographic Details
Main Author:	Carl Peterson (12969447) (author)
Other Authors:	Arkka Bhattacharyya (13916103) (author), Kittamet Chanchaiworawit (19865277) (author), Rachel Kahler (19865280) (author), Saurav Roy (17090797) (author), Yizheng Liu (9605570) (author), Steve Rebollo (19865283) (author), Anna Kallistova (12038801) (author), Tom Mates (2396590) (author), Sriram Krishnamoorthy (1949197) (author)
Published:	2024
Subjects:	Physical sciences Ga2O3 MOCVD Mobility Doping
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Supplementary Material

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