To monitor fetal distress monitoring, many CTG devices are placed in rooms within a distributed SDN-IoT architecture.

<p>After this, the control layer receives the data gathered from these devices for additional processing. We apply a Deep Learning model in this three-layered architecture to identify and categorize anomalies</p>

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Bibliographic Details
Main Author: Amin Ullah (12015113) (author)
Other Authors: Qazi Mazhar Ul Haq (21866718) (author), Zabeeh Ullah (21866721) (author), Jaroslav Frnda (14564125) (author), Muhammad Shahid Anwar (19660537) (author)
Published: 2025
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