From Beam Damage to Massive Reaction Amplification under the Electron Microscope: An Ionization-Induced Chain Reaction in Crystals of a Dewar Benzene

From Beam Damage to Massive Reaction Amplification under the Electron Microscope: An Ionization-Induced Chain Reaction in Crystals of a Dewar Benzene

Electron microscopy in its various forms is one of the most powerful imaging and structural elucidation methods in nanotechnology where sample information is generally limited by random chemical and structural damage. Here we show how a well-selected chemical probe can be used to transform indiscrim...

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Bibliographic Details
Main Author: Krzysztof A. Konieczny (20396762) (author)
Other Authors: Indrajit Paul (3837961) (author), Jose A. Rodriguez (1982692) (author), Miguel A. Garcia-Garibay (1282440) (author)
Published: 2024
Subjects:
Biophysics
Biochemistry
Microbiology
Physiology
Evolutionary Biology
Immunology
Inorganic Chemistry
Infectious Diseases
Chemical Sciences not elsewhere classified
soft organic matter
massive reaction amplification
induced chain reaction
dewar benzene exposed
cation chain reaction
bond isomerization radical
selected chemical probe
structural elucidation methods
energy electron beams
clean chemical processes
random chemical
structural damage
electron microscope
clean valence
various forms
sample information
powerful imaging
generally limited
beam damage
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