Efficient static compaction techniques for sequential circuits based on reverse-order restoration and test relaxation
The authors present efficient reverse-order-restoration (ROR)-based static test compaction techniques for synchronous sequential circuits. Unlike previous ROR techniques that rely on vector-by-vector fault-simulation-based restoration of test subsequences, the authors’ technique restores test sequen...
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| Other Authors: | , , |
| Format: | article |
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2006
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| Subjects: | |
| Online Access: | https://eprints.kfupm.edu.sa/id/eprint/17/1/J_ElMaleh_TCAD_November2006.pdf |
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