Efficient static test compaction algorithms for combinational circuits based on test relaxation

Efficient static test compaction algorithms for combinational circuits based on test relaxation

محفوظ في:

التفاصيل البيبلوغرافية
المؤلف الرئيسي:	Osais, Yahya Esmail (author)
مؤلفون آخرون:	unknown (author)
التنسيق:	masterThesis
منشور في:	2003
الموضوعات:	Computer
الوصول للمادة أونلاين:	https://eprints.kfupm.edu.sa/id/eprint/10258/1/10258.pdf
الوسوم:	إضافة وسم لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!

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