El-Maleh, A. H., Al-Suwaiyan, A., & unknown. (2002). An Efficient Test Relaxation Technique for Combinational & Full-Scan Sequential Circuits.
Chicago Style (17th ed.) CitationEl-Maleh, Aiman H., Ali Al-Suwaiyan, and unknown. An Efficient Test Relaxation Technique for Combinational & Full-Scan Sequential Circuits. 2002.
MLA (9th ed.) CitationEl-Maleh, Aiman H., et al. An Efficient Test Relaxation Technique for Combinational & Full-Scan Sequential Circuits. 2002.
Warning: These citations may not always be 100% accurate.