A model for low-energy thick-target bremsstrahlung produced in a scanning electron microscope
Thick-target bremsstrahlung measurements were obtained for various atomic numbers and for energies between 10 and 25 keV. A Jeol JSM 6100 scanning electron microscope was used for the electron beam and a Oxford Instruments Link Si(Li) detector for the bremsstrahlung spectrum. The experimental data w...
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2001
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| Online Access: | http://hdl.handle.net/10725/3600 http://dx.doi.org/10.1002/xrs.465 http://onlinelibrary.wiley.com/doi/10.1002/xrs.465/abstract |
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